[Japan Soc. Appl. Phys 1995 Symposium on VLSI Technology. Digest of Technical Papers - Kyoto, Japan (6-8 June 1995)] 1995 Symposium on VLSI Technology. Digest of Technical Papers - Leakage mechanism due to floating body and countermeasure on dynamic retention mode of SOI-DRAM
Morishita, F., Suma, K., Hirose, M., Tsuruda, T., Yamaguchi, Y., Eimori, T., Oashi, T., Arimoto, K., Inoue, Y., Nishimura, T.Year:
1995
Language:
english
DOI:
10.1109/vlsit.1995.520897
File:
PDF, 253 KB
english, 1995