[IEEE 2011 IEEE 17th International Symposium for Design and Technology in Electronic Packaging (SIITME) - Timisoara, Romania (2011.10.20-2011.10.23)] 2011 IEEE 17th International Symposium for Design and Technology in Electronic Packaging (SIITME) - Measuring thickness based on the grayscale value of C-mode SAM images
Harkai, Endre, Gordon, PeterYear:
2011
Language:
english
DOI:
10.1109/siitme.2011.6102744
File:
PDF, 635 KB
english, 2011