[IEEE Comput. Soc 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. DFT 2002 - Vancouver, BC, Canada (6-8 Nov. 2002)] 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. - Neighbor current ratio (NCR): a new metric for I/sub DDQ/ data analysis
Sabade, S.S., Walker, D.M.H.Year:
2002
Language:
english
DOI:
10.1109/dftvs.2002.1173535
File:
PDF, 397 KB
english, 2002