[IEEE 2009 International Conference on Industrial and Information Systems (IIS) - Haikou, China (2009.04.24-2009.04.25)] 2009 International Conference on Industrial and Information Systems - A SOM-Based of Fault Diagnosis for WAN
Pan, Zhi-Song, Wang, Qiong, Ni, Gui-Qiang, Hu, Gu-YuYear:
2009
Language:
english
DOI:
10.1109/iis.2009.114
File:
PDF, 1.37 MB
english, 2009