A comprehensive study of performance and reliability of P,...

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A comprehensive study of performance and reliability of P, As, and hybrid As/P nLDD junctions for deep-submicron CMOS logic technology

D. Nayak, Ming-yin Hao, J. Umali, R. Rakkhit
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Language:
english
DOI:
10.1109/55.585358
File:
PDF, 71 KB
english
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