[IEEE 2010 IEEE/ASME International Conference on Advanced...

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[IEEE 2010 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM) - Montreal, QC, Canada (2010.07.6-2010.07.9)] 2010 IEEE/ASME International Conference on Advanced Intelligent Mechatronics - Reliability data for improvement of decision-making in Analytical Redundancy Relations Bond Graph based diagnosis

Zaidi, Abdelaziz, Tagina, Moncef, Bouamama, Belkacem Ould
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Year:
2010
Language:
english
DOI:
10.1109/aim.2010.5695771
File:
PDF, 169 KB
english, 2010
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