[IEEE 2009 10th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2009.03.16-2009.03.18)] 2009 10th International Symposium on Quality of Electronic Design - An enhanced topology for reliability of a high performance 3.3V I/O buffer in a single-well bulk CMOS 1.8v-oxide low voltage process

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