[IEEE LEOS'96 9th Annual Meeting IEEE Lasers and Electro-Optics Society - Boston, MA, USA (18-19 Nov. 1996)] Conference Proceedings LEOS'96 9th Annual Meeting IEEE Lasers and Electro-Optics Society - In situ thickness monitoring and adjusting during MBE growth for 980 nm VCSEL
Zhong Pan,, Zengqi Zhou,, Zhichan Niu,, Yi Zhang,, Ronghan Wu,, Wei Wang,Volume:
2
Year:
1996
Language:
english
DOI:
10.1109/leos.1996.571619
File:
PDF, 175 KB
english, 1996