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[IEEE 2014 27th International Vacuum Nanoelectronics Conference (IVNC) - Engelberg, Switzerland (2014.7.6-2014.7.10)] 2014 27th International Vacuum Nanoelectronics Conference (IVNC) - Photo-cathode analysis for SwissFEL
Schaer, M., Craievich, P., Stingelin, L.Year:
2014
Language:
english
DOI:
10.1109/ivnc.2014.6894797
File:
PDF, 563 KB
english, 2014