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[IEEE 2011 IEEE GCC Conference and Exhibition (GCC) - Dubai, United Arab Emirates (2011.02.19-2011.02.22)] 2011 IEEE GCC Conference and Exhibition (GCC) - Surface roughness determination using wavelets
Chacko, Sibi, Udayakumar, RYear:
2011
Language:
english
DOI:
10.1109/ieeegcc.2011.5752544
File:
PDF, 417 KB
english, 2011