[IEEE Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Xi'an, China (2003.11.19-2003.11.19)] Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Efficient diagnosis for multiple intermittent scan chain hold-time faults
Yu Huang,, Huan-Yung Tseng,, Wu-Tung Cheng,, Alou Huang,, Cheng-Ju Hsieh,, Yu-Ting Hung,Year:
2003
Language:
english
DOI:
10.1109/ats.2003.1250781
File:
PDF, 245 KB
english, 2003