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[IEEE 2009 International Conference on Microelectronics - ICM - Marrakech, Morocco (2009.12.19-2009.12.22)] 2009 International Conference on Microelectronics - ICM - Aspect-based ABV for SystemC transaction level models
Kallel, Meriam, Lahbib, Younes, Tourki, Rached, Baganne, AdelYear:
2009
Language:
english
DOI:
10.1109/icm.2009.5418623
File:
PDF, 573 KB
english, 2009