[IEEE 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Xi'an, China (2012.08.29-2012.09.1)] 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Influence of processing parameter on nanoscale anodic oxidation by AFM
Leng, Yanbing, Dong, Lianhe, Sun, Yanjun, Chen, Zhe, Ma, ZhenfangYear:
2012
Language:
english
DOI:
10.1109/3m-nano.2012.6473008
File:
PDF, 455 KB
english, 2012