[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Transistor sizing for radiation hardening
Quming Zhou,, Mohanram, K.Year:
2004
Language:
english
DOI:
10.1109/relphy.2004.1315343
File:
PDF, 385 KB
english, 2004