[IEEE Fifth IEEE International Vacuum Electronics Conference - Monterey, CA, USA (27-29 April 2004)] Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786) - Measurements of secondary electron yield from materials with application to depressed collectors
Zameroski, N., Svimonishvili, T., Gilmore, M., Schamiloglu, E., Gaudet, J.Year:
2004
Language:
english
DOI:
10.1109/ivelec.2004.1316243
File:
PDF, 137 KB
english, 2004