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[IEEE IEEE International Frequency Control Sympposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. 2003 - Tampa, Fl, USA (4-8 May 2003)] IEEE International Frequency Control Sympposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 - Breakdown effects on MOS varactors and VCO's
Sadat, A., Hong Yang,, Enjun Xiao,, Yuan, J.S.Year:
2003
Language:
english
DOI:
10.1109/freq.2003.1275151
File:
PDF, 207 KB
english, 2003