![](/img/cover-not-exists.png)
[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Active Power-Gating-Induced Power/Ground Noise Alleviation Using Parasitic Capacitance of On-Chip Memories
Wang, Xuan, Xu, Jiang, Zhang, Wei, Wu, Xiaowen, Ye, Yaoyao, Wang, Zhehui, Nikdast, Mahdi, Wang, ZheYear:
2013
Language:
english
DOI:
10.7873/date.2013.253
File:
PDF, 160 KB
english, 2013