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[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Cell-aware Production test results from a 32-nm notebook processor
Hapke, F., Reese, M., Rivers, J., Over, A., Ravikumar, V., Redemund, W., Glowatz, A., Schloeffel, J., Rajski, J.Year:
2012
Language:
english
DOI:
10.1109/test.2012.6401533
File:
PDF, 1.23 MB
english, 2012