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[IEEE 2006 SICE-ICASE International Joint Conference - Busan Exhibition & Convention Center-BEXCO, Busan, Korea (2006.10.18-2006.10.21)] 2006 SICE-ICASE International Joint Conference - Analysis of system structure around degenerate critical points

Nishida, Gou, Nakamura, Hisakazu, Luo, Zhiwei
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Year:
2006
Language:
english
DOI:
10.1109/sice.2006.315105
File:
PDF, 4.65 MB
english, 2006
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