[IEEE 2014 IEEE International Solid- State Circuits Conference (ISSCC) - San Francisco, CA, USA (2014.02.9-2014.02.13)] 2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC) - 2.7 A coefficient-error-robust FFE TX with 230% eye-variation improvement without calibration in 65nm CMOS technology

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