RTN distribution comparison for bulk, FDSOI and FinFETs...

Microelectronics Reliability 2014 / 09 Vol. 54; Iss. 9-10

RTN distribution comparison for bulk, FDSOI and FinFETs devices

Gerrer, L., Amoroso, S.M., Hussin, R., Asenov, A.
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.013
Date:
September, 2014
File:
PDF, 1.12 MB
english, 2014
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