Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS
Dutertre, J.M., Possamai Bastos, R., Potin, O., Flottes, M.L., Rouzeyre, B., Di Natale, G., Sarafianos, A.Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.151
Date:
September, 2014
File:
PDF, 768 KB
english, 2014