Correlation of radiation damage effects in high resistivity...

IEEE Transactions on Nuclear Science 1997 / 6 Vol. 44; Iss. 3

Correlation of radiation damage effects in high resistivity silicon detectors with results from deep level spectroscopy

Feick, H., Fretwurst, E., Moll, M., Lindstrom, G.
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Volume:
44
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.603760
Date:
June, 1997
File:
PDF, 1.03 MB
english, 1997
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