![](/img/cover-not-exists.png)
Correlation of radiation damage effects in high resistivity silicon detectors with results from deep level spectroscopy
Feick, H., Fretwurst, E., Moll, M., Lindstrom, G.Volume:
44
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.603760
Date:
June, 1997
File:
PDF, 1.03 MB
english, 1997