[IEEE 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Warsaw, Poland (2014.4.23-2014.4.25)] 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Test data compression based on reuse and bit-flipping of parts of dictionary entries
Sismanoglou, Panagiotis, Nikolos, DimitrisYear:
2014
Language:
english
DOI:
10.1109/ddecs.2014.6868773
File:
PDF, 367 KB
english, 2014