![](/img/cover-not-exists.png)
Superior hot carrier reliability of single halo (SH) silicon-on-insulator (SOI) nMOSFET in analog applications
Hakim, N., Rao, V.R., Vasi, J., Woo, J.C.S.Volume:
5
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2005.843832
Date:
March, 2005
File:
PDF, 399 KB
english, 2005