Superior hot carrier reliability of single halo (SH)...

IEEE Transactions on Device and Materials Reliability 2005 / 03 Vol. 5; Iss. 1

Superior hot carrier reliability of single halo (SH) silicon-on-insulator (SOI) nMOSFET in analog applications

Hakim, N., Rao, V.R., Vasi, J., Woo, J.C.S.
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Volume:
5
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2005.843832
Date:
March, 2005
File:
PDF, 399 KB
english, 2005
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