Short-circuit protection for an IGBT with detecting the gate voltage and gate charge
Hasegawa, K., Yamamoto, K., Yoshida, H., Hamada, K., Tsukuda, M., Omura, I.Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.083
Date:
September, 2014
File:
PDF, 653 KB
english, 2014