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[IEEE IEEE IV2003 Intelligent Vehicles Symposium. Proceedings - Columbus, OH, USA (9-11 June 2003)] IEEE IV2003 Intelligent Vehicles Symposium. Proceedings (Cat. No.03TH8683) - Automatic tire pressure fault monitor using wavelet-based probability density estimation
Li Li,, Fei-Yue Wang,, Qunzhi Zhou,, Guoling Shan,Year:
2003
Language:
english
DOI:
10.1109/ivs.2003.1212887
File:
PDF, 252 KB
english, 2003