Hot-carrier damage from high to low voltage using the...

Microelectronic Engineering 2007 Vol. 84; Iss. 9-10

Hot-carrier damage from high to low voltage using the energy-driven framework

C. Guerin, V. Huard, A. Bravaix
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Volume:
84
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2007.04.104
File:
PDF, 670 KB
english, 2007
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