Experimental and numerical analysis of channel-length-dependent electrical properties in bottom-gate, bottom-contact organic thin-film transistors with Schottky contact
Noda, Kei, Wada, Yasuo, Toyabe, ToruVolume:
15
Language:
english
Journal:
Organic Electronics
DOI:
10.1016/j.orgel.2014.10.017
Date:
December, 2014
File:
PDF, 849 KB
english, 2014