Dispersion study of DC and Low Frequency Noise in SiGe:C Heterojunction Bipolar Transistors used for mm-Wave to Terahertz applications
Seif, M., Pascal, F., Sagnes, B., Hoffmann, A., Haendler, S., Chevalier, P., Gloria, D.Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.027
Date:
September, 2014
File:
PDF, 1.32 MB
english, 2014