[IEEE 33rd Applied Imagery Pattern Recognition Workshop...

  • Main
  • [IEEE 33rd Applied Imagery Pattern...

[IEEE 33rd Applied Imagery Pattern Recognition Workshop (AIPR'04) - Washington, DC, USA (13-15 Oct. 2004)] 33rd Applied Imagery Pattern Recognition Workshop (AIPR'04) - Multiple-Aperture Imaging Spectrometer: Computer Simulation and Experimental Validation

Kendrick, R., Smith, E.H., Christie, D.N., Bennett, D.A., Theil, D., Barrett, E.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2004
Language:
english
DOI:
10.1109/aipr.2004.32
File:
PDF, 681 KB
english, 2004
Conversion to is in progress
Conversion to is failed