![](/img/cover-not-exists.png)
[IEEE 33rd Applied Imagery Pattern Recognition Workshop (AIPR'04) - Washington, DC, USA (13-15 Oct. 2004)] 33rd Applied Imagery Pattern Recognition Workshop (AIPR'04) - Multiple-Aperture Imaging Spectrometer: Computer Simulation and Experimental Validation
Kendrick, R., Smith, E.H., Christie, D.N., Bennett, D.A., Theil, D., Barrett, E.Year:
2004
Language:
english
DOI:
10.1109/aipr.2004.32
File:
PDF, 681 KB
english, 2004