Accelerated degradation data of SiC MOSFETs for lifetime...

Microelectronics Reliability 2014 / 09 Vol. 54; Iss. 9-10

Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment

Santini, T., Morand, S., Fouladirad, M., Phung, L.V., Miller, F., Foucher, B., Grall, A., Allard, B.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.082
Date:
September, 2014
File:
PDF, 1.30 MB
english, 2014
Conversion to is in progress
Conversion to is failed