Qualification procedure for moisture in embedded capacitors

Microelectronics Reliability 2014 / 09 Vol. 54; Iss. 9-10

Qualification procedure for moisture in embedded capacitors

Frémont, Hélène, Kludt, Jörg, Wade, Massar, Weide-Zaage, Kirsten, Bord-Majek, Isabelle, Duchamp, Geneviève
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.117
Date:
September, 2014
File:
PDF, 1.16 MB
english, 2014
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