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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Evaluating and Improving Transient Error Tolerance of CMOS Digital VLSI Circuits
Zhao, Chong, Dey, SujitYear:
2006
Language:
english
DOI:
10.1109/test.2006.297680
File:
PDF, 13.06 MB
english, 2006