A study of deposition conditions on charging properties of...

A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches

Koutsoureli, M., Michalas, L., Gantis, A., Papaioannou, G.
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.08.002
Date:
September, 2014
File:
PDF, 864 KB
english, 2014
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