![](/img/cover-not-exists.png)
Sn whisker evaluations in 3D microbumped structures
Vakanas, G.P., Vandecasteele, B., Schaubroek, D., De Messemaeker, J., Willems, G., Ashworth, M.A., Wilcox, G.D., De Wolf, I.Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.110
Date:
September, 2014
File:
PDF, 3.31 MB
english, 2014