Particle Monte Carlo modeling of single-event transient...

Microelectronics Reliability 2014 / 09 Vol. 54; Iss. 9-10

Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits

Autran, J.L., Glorieux, M., Munteanu, D., Clerc, S., Gasiot, G., Roche, P.
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.088
Date:
September, 2014
File:
PDF, 1.16 MB
english, 2014
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