Reliability of ESD protection devices designed in a 3D...

Microelectronics Reliability 2014 / 09 Vol. 54; Iss. 9-10

Reliability of ESD protection devices designed in a 3D technology

Courivaud, B., Nolhier, N., Ferru, G., Bafleur, M., Caignet, F.
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.136
Date:
September, 2014
File:
PDF, 2.43 MB
english, 2014
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