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HCS degradation of 5nm oxide high-voltage PLDMOS
Olk, C., Aresu, S., Rudolf, R., Röhner, M., Gustin, W., Stein Von Kamienski, E.Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.048
Date:
September, 2014
File:
PDF, 1.32 MB
english, 2014