Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs
Kastensmidt, F.L., Tonfat, J., Both, T., Rech, P., Wirth, G., Reis, R., Bruguier, F., Benoit, P., Torres, L., Frost, C.Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.100
Date:
September, 2014
File:
PDF, 965 KB
english, 2014