Characterization of ion/electron beam induced deposition of...

Characterization of ion/electron beam induced deposition of electrical contacts at the sub-μm scale

D. Brunel, D. Troadec, D. Hourlier, D. Deresmes, M. Zdrojek, T. Mélin
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
88
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.mee.2011.03.011
File:
PDF, 792 KB
english, 2011
Conversion to is in progress
Conversion to is failed