Electro Optical Terahertz Pulse Reflectometry, a non...

Microelectronics Reliability 2014 / 09 Vol. 54; Iss. 9-10

Electro Optical Terahertz Pulse Reflectometry, a non destructive technique to localize defects on various type of package

Reverdy, A., Marchetti, M., Fudoli, A., Pagani, A., Goubier, V., Cason, M., Alton, J., Igarashi, M., Gibbons, G.
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.036
Date:
September, 2014
File:
PDF, 2.19 MB
english, 2014
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