Signal noise perturbation on automotive mixed-mode...

Signal noise perturbation on automotive mixed-mode semiconductor device generated by graded substrate defect

Weber, Y., Buffo, L., Vanhuffel, B., Lee, N., Stirlen, N., Chen, J., Wang, X.D.
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.061
Date:
September, 2014
File:
PDF, 2.06 MB
english, 2014
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