![](/img/cover-not-exists.png)
Signal noise perturbation on automotive mixed-mode semiconductor device generated by graded substrate defect
Weber, Y., Buffo, L., Vanhuffel, B., Lee, N., Stirlen, N., Chen, J., Wang, X.D.Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.061
Date:
September, 2014
File:
PDF, 2.06 MB
english, 2014