III–V nMOSFETs – Some issues associated with roadmap...

Microelectronic Engineering 2011 Vol. 88; Iss. 7

III–V nMOSFETs – Some issues associated with roadmap worthiness (invited)

Iain Thayne, Steven Bentley, Martin Holland, Wout Jansen, Xu Li, Douglas Macintyre, Stephen Thoms, Byungha Shin, Jaesoo Ahn, Paul McIntyre
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Volume:
88
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.mee.2011.03.100
File:
PDF, 1.08 MB
english, 2011
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