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[IEEE 4th IEEE Conference on Nanotechnology, 2004. - Munich, Germany (16-19 Aug. 2004)] 4th IEEE Conference on Nanotechnology, 2004. - Defect characterization and yield analysis of array-based nanoarchitecture
Shanrui Zhang,, Minsu Choi,, Nohpill Park,Year:
2004
Language:
english
DOI:
10.1109/nano.2004.1392246
File:
PDF, 221 KB
english, 2004