Charge trapping and interface characteristics in...

Microelectronic Engineering 2011 Vol. 88; Iss. 7

Charge trapping and interface characteristics in normally-off Al2O3/GaN-MOSFETs

Ki-Won Kim, Sung-Dal Jung, Dong-Seok Kim, Ki-Sik Im, Hee-Sung Kang, Jung-Hee Lee, Youngho Bae, Dae-Hyuk Kwon, Sorin Cristoloveanu
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Volume:
88
Year:
2011
Language:
english
Pages:
3
DOI:
10.1016/j.mee.2011.03.116
File:
PDF, 459 KB
english, 2011
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