Resistive switching characteristics of CMOS embedded...

Microelectronic Engineering 2011 Vol. 88; Iss. 7

Resistive switching characteristics of CMOS embedded HfO2-based 1T1R cells

D. Walczyk, Ch. Walczyk, T. Schroeder, T. Bertaud, M. Sowińska, M. Lukosius, M. Fraschke, B. Tillack, Ch. Wenger
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Volume:
88
Year:
2011
Language:
english
Pages:
3
DOI:
10.1016/j.mee.2011.03.123
File:
PDF, 590 KB
english, 2011
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