[IEEE 2013 36th International Spring Seminar on Electronics...

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[IEEE 2013 36th International Spring Seminar on Electronics Technology (ISSE) - Alba Iulia, Romania (2013.05.8-2013.05.12)] Proceedings of the 36th International Spring Seminar on Electronics Technology - An AFM study regarding the effect of annealing on the microstructure of gold thin films

Bonyar, Attila, Lehoczki, Peter
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Year:
2013
Language:
english
DOI:
10.1109/isse.2013.6648265
File:
PDF, 484 KB
english, 2013
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