[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Study of turn-on characteristics of SCRs for ESD protection with TDR-O and TDR-S TLPs
Huo, Ming-xu, Han, Yan, Li, You, Bo Song,, Liou, Juin-jie, Dong, Shu-rong, Kou-bao Ding,, Guo, Wei, Dahai Huang,, Li, Mingliang, Ma, Fei, Miao, MengYear:
2010
Language:
english
DOI:
10.1109/ipfa.2010.5532309
File:
PDF, 314 KB
english, 2010