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Study of GaAs layers grown on Ge substrates by MOVPE and in situ monitored by laser reflectometry
A Rebey, M.M Habchi, Z Benzarti, B El JaniVolume:
35
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.mejo.2003.10.001
File:
PDF, 182 KB
english, 2004